"The blob analysis functions provide many input measurements that are easy to calculate and easily accessed within our program. Measurements that are not needed are easily removed and don't add to the processing time. Having access to the blob (defect) location allows us to make our own specialized measurements when necessary. In-depth investigation of MIL showed us that the MIL Blob Analysis module would solve our need to measure defects and supply data to our Neural Network Classifier.”
James Gibbons, Software Engineer, Ventek
"Where the Matrox Imaging Library software was especially helpful was in enabling us to get into the image and still extract the detail we needed."
Jon Pocock, VIEWTM Product Manager, AEA Technology Rail